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http://ipicyt.repositorioinstitucional.mx/jspui/handle/1010/1852| Effect of an electric field within microscopy focused ion beam (FIB) between manipulator sharp and the ion trap of the electron detector | |
| Jorge Alberto Gómez Antonino Pérez Hernández José Alberto Duarte Moller | |
| Acceso Abierto | |
| Atribución-NoComercial-SinDerivadas | |
| 10.5897/IJPS11.352 | |
| Focused ion beam (FIB) mono beam Contrast effects Electric fields Height | |
| "The manipulation of samples with micro manipulators sharps in the normal axis to the observation plane is practically blind in microscopy focused ion beam (FIB) mono beam. The application of a negative potential to the manipulator sharp has been considered, which causes differences of electrical potential between the detector and the sample holder, generating an electric field between the sharp and the sample. This makes the electrons, aside the sample, undergo a greater deflection, reflecting in poorer contrast image. This deflection depends on a great extension of the sample holder height between the micromanipulator sharp, voltage deflector, q/m electron factor and electron acceleration." | |
| Academic Journals | |
| 2011 | |
| Artículo | |
| Gómez Jorge A., Pérez Hernández and A. Duarte-Moller, A. (2011). Effect of an electric field within microscopy focused ion beam (FIB) between manipulator sharp and the ion trap of the electron detector. International Journal of the Physical Sciences Vol. 6(22), pp. 5104-5108. | |
| FÍSICA | |
| Versión publicada | |
| publishedVersion - Versión publicada | |
| Aparece en las colecciones: | Publicaciones Científicas Nanociencias y Materiales |
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|---|---|---|---|
| IntJPhysSSci6(2011)5104.pdf | 679.57 kB | Adobe PDF | Visualizar/Abrir |